Electronic Science and Technology ›› 2025, Vol. 38 ›› Issue (2): 23-34.doi: 10.16180/j.cnki.issn1007-7820.2025.02.004

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Fault Identification of Complex Analog Circuit Based on Deep Learning

HUANG Zehua1,2, BI Guihong1(), ZHANG Zirui1   

  1. 1. Faculty of Electric Power Engineering,Kunming University of Science and Technology,Kunming 650500,China
    2. Yongzhou Industrial Trade Secondary Professional School,Yongzhou 425300,China
  • Received:2023-06-19 Revised:2023-07-16 Online:2025-02-15 Published:2025-01-16
  • Supported by:
    Science and Technology Plan of Science and Technology Department of Yunnan(202201AT070155)

Abstract:

For complex analog circuits with complex fault transfer relationships and complex nonlinear relationships between fault types and fault features, which cause difficulties in feature extraction and fault identification. This study presents a fault diagnosis method for analog circuits based on two measuring points-CEEMDAN(Complete Ensemble Empirical Mode Decomposition with Adaptive Noise)-multi-scale false-color image-ALEXNet network. A new combined fault sample is constructed by connecting the output signals of two measuring points in a complex analog circuit. The combined fault sample data of two measuring points improves the ability to characterize the whole fault state of the complex analog circuit. The combined fault sample signals are decomposed in multi-scale, and the multi-scale data matrix is mapped to a two-dimensional false-color graph to form a multi-scale false-color image with abundant information and obvious features. Based on AlexNet's excellent image feature mining and learning ability, multi-scale false-color images of different fault types were input into AlexNet for model transfer training and fault identification. By comparing and analyzing the single and double faults and mixed faults of simple circuit and complex circuit, it is proved that the proposed method can achieve higher recognition accuracy for different fault types of complex analog circuit.

Key words: analog circuit, fault diagnosis, double fault, CEEMDAN, false color, AlexNet, low pass filter, feature-based visualization

CLC Number: 

  • TN710