Electronic Science and Technology ›› 2025, Vol. 38 ›› Issue (2): 70-77.doi: 10.16180/j.cnki.issn1007-7820.2025.02.009

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Total Jitter Prediction Method of FPGA Embedded High-Speed Interface Based on Optimized BPNN

YE Xiangyu1(), LIN Xiaohui2, DING Jiangqiao1, XIE Weikun2   

  1. 1. School of Electronic and Information Engineering,Nanjing University of Information Science and Technology, Nanjing 211800,China
    2. The 58th Research Institute,China Electronics Technology Group Corporation, Wuxi 214072,China
  • Received:2023-08-10 Revised:2023-09-02 Online:2025-02-15 Published:2025-01-16
  • Supported by:
    Project of Equipment Pre-Research(31517040401)

Abstract:

In view of the problem that ATE(Automated Test Equipment) can not measure the total jitter of FPGA(Field-Programmable Gate Array) embedded high-speed interface directly, this study presents a method to predict the total jitter of high-speed interface based on optimized BPNN(Back Propagation Neural Network). The GA-BP neural network is formed to optimize the initial weight and parameter seeking process of BPNN using the strong global search ability of GA(Genetic Algorithm), and improve the accuracy of predicting the total jitter. The GA_BP total jitter prediction model was constructed using MATLAB software to predict and optimize the screened jitter data. The experimental results show that compared with the non-optimized BP neural network and the traditional Elman neural network prediction model, the mean square error of the GA_BP prediction model is declined by 75.5% and 88.0%, and the number of iterations is reduced by 68.0% and 59.8%, respectively. It indicates that the proposed GA_BP model has higher prediction accuracy and iteration efficiency, and can be applied to total jitter production test in ATE.

Key words: high-speed interface, total jitter prediction, optimized BP neural network, genetic algorithm, Grubbs criterion, FPGA, mean square error, production test

CLC Number: 

  • TP27