›› 2010, Vol. 23 ›› Issue (8): 18-.

• Articles • Previous Articles     Next Articles

Research on and Simulation of A CCD Image Sensor with a Vertical Anti-blooming Structure

 WU Li-Fan   

  1. (School of Electronic Engineering,Xi'an University of Post & Telecommunications,Xi'an 710121,China)
  • Online:2010-08-15 Published:2011-03-28


By using MEDICI,A CCD device simulation structure with vertical anti-blooming is calculated numerically to eliminate blooming and smear in the CCD image sensor in its exposure to intense sunlight.The effect of the 1PW impurity concentration parameter on the vertical anti-blooming ability of CCD is analyzed and the vertical anti-blooming structure of CCD is optimized.The electronic shutter is developed by the work principle of vertical anti-blooming.

Key words: CCD;blooming;anti-blooming;device simulation

CLC Number: 

  • TP212