Abstract:

In the crystalloids growth detecting system based on LabVIEW,according to the growth features of monocrystalline silicon and the principle of least square method fictions,the image processing is done on collected monocrystalline silicon growth information by adopting graphic programming languages,during which spline curve fitting is applied to some of the "ptroelectric rings".Therefore,the diameter of the crystalloids growth is able to be detected via the Arc fit.This experiment exhibits that such a rigorous design is capable of the spline curve fitting function,and can detect the diameter of the crystalliods growth of monocrystalline silicon,and thus meeting all requirements of detecting system.

Key words: LabVIEW;least square method;arc fit