J4 ›› 2013, Vol. 40 ›› Issue (6): 147-154.doi: 10.3969/j.issn.1001-2400.2013.06.025

• 研究论文 • 上一篇    下一篇

三层粗糙面电磁散射的矩量法研究

张连波;郭立新;苟雪银;王安琪   

  1. (西安电子科技大学 理学院,陕西 西安  710071)
  • 收稿日期:2013-04-07 出版日期:2013-12-20 发布日期:2014-01-10
  • 通讯作者: 张连波
  • 作者简介:张连波(1988-),男,西安电子科技大学硕士研究生,E-mail: lianbozhang@163.com.
  • 基金资助:

    国家杰出青年科学基金资助项目(61225002);高等学校博士学科点专项科研基金资助项目(20100203110016);中央高校基本科研业务费专项资金资助项目(K50510070001)

Method of moment investigation on electromagnetic scattering  from the three-layered rough interfaces

ZHANG Lianbo;GUO Lixin;GOU Xueyin;WANG Anqi   

  1. (School of Science, Xidian Univ., Xi'an  710071, China)
  • Received:2013-04-07 Online:2013-12-20 Published:2014-01-10
  • Contact: ZHANG Lianbo

摘要:

应用矩量法、采用脉冲基函数结合点匹配技术研究了三层粗糙面的电磁散射特性,给出了积分方程、阻抗矩阵元素表达式及散射系数的定义式.利用蒙特卡罗方法模拟了用高斯粗糙面近似代替实际复杂的粗糙面,通过与时域有限差分方法计算结果的对比,说明该方法的正确性.将所研究的三层粗糙面散射模型退化成单层粗糙面散射模型,与已有的单层粗糙面散射模型计算结果进行对比,说明所给方法的通用性.最后讨论了入射角、介电常数、均方根高度、相关长度和每层粗糙面的厚度对三层粗糙面双站散射系数的影响.

关键词: 矩量法, 三层粗糙面, 电磁散射

Abstract:

The properties of electromagnetic(EM) scattering from a multi-layered rough surfaces have been investigated through the method of moments(MOM) with the pulse basis function and the point matching technique. Theoretical formulas such as integral equations, matrix equations, and the definition of the bistatic scattering coefficient of this scattering problem have been derived in detail. The Gaussian rough surface has been applied to simulate the realistic surface by the Monte Carlo method. Firstly, the validity of the presented method has been shown by comparing with the finite difference time domain(FDTD). The versatility of the presented method has been demonstrated by degenerating the three-layered rough interfaces to a single-layered rough interface and then comparing with the exit scattering model. Finally, the influences of the characteristic parameters such as incident angle, relative permittivity of the medium, root mean square height and correlation length, as well as the height of each rough surface on the bistatic scattering coefficient are discussed in detail.

Key words: method of moment, three-layered rough interfaces, electromagnetic scattering

中图分类号: 

  • O441.4