西安电子科技大学学报

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嵌入D2D功能蜂窝网络中接入失败概率估计方法

孙鹏;张海林   

  1. (西安电子科技大学 综合业务网理论及关键技术国家重点实验室,陕西 西安 710071)
  • 收稿日期:2016-12-19 出版日期:2017-12-20 发布日期:2018-01-18
  • 作者简介:孙鹏(1987-),男,西安电子科技大学博士研究生,E-mail:pengsun.xidian@gmail.com
  • 基金资助:

    国家自然科学基金资助项目(61671347);高等学校学科创新引智计划(“111”计划)资助项目(B08038)

Estimation of access failure probability in D2D underlaid cellular networks

SUN Peng;ZHANG Hailin   

  1. (State Key Lab. of Integrated Service Networks, Xidian Univ., Xi'an 710071, China)
  • Received:2016-12-19 Online:2017-12-20 Published:2018-01-18

摘要:

将终端直通技术引入蜂窝网络,可以有效降低终端设备能耗,并提高频谱效率.但蜂窝用户会受到共信道终端直通用户的干扰,导致蜂窝业务接入失败.在嵌入终端直通功能蜂窝网络中,终端直通干扰和频谱资源不足都会导致蜂窝业务的接入失败.针对现有研究缺乏对嵌入终端直通功能蜂窝网络中接入性能分析的问题,提出了新生业务接入失败概率和切换业务接入失败概率来分析终端直通干扰和资源不足对蜂窝业务接入性能的影响.基于随机几何和随机过程,建立了一个随机网络模型来估计嵌入终端直通功能蜂窝网络中新生业务接入失败概率和切换业务接入失败概率.利用上述两个概率可以为网络规划提供帮助,保障蜂窝业务的成功接入.通过仿真,验证了估计的接入失败概率的准确性.

关键词: 蜂窝网络, 终端直通, 随机几何, 随机过程, 接入失败概率

Abstract:

Device-to-Device (D2D) communication can reduce the mobile devices' energy consumption and increase the spectral efficiency in D2D underlaid cellular networks. However, D2D users will interfere with co-channel cellular users, which can lead to cellular communication access failures. There are two reasons for cellular communication access failures: (1)D2D interference and (2)insufficient spectrum resources. To address the absence of research on the performance of cellular services' access in D2D underlaid cellular networks, this paper defines the new services' access failure probability and handoff services' access failure probability to evaluate the effect of both D2D interference and limited resources on cellular communication access. Based on the stochastic geometry and stochastic process, a random network model is presented to estimate the access failure probabilities, which can provide guidelines for network design to ensure cellular services' access. The accuracy of the estimated access failure probability is validated through extensive simulations.

Key words: cellular networks, device-to-device communications, stochastic geometry, stochastic process, access failure probabilities