西安电子科技大学学报 ›› 2019, Vol. 46 ›› Issue (4): 137-143.doi: 10.19665/j.issn1001-2400.2019.04.019

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高分辨InSAR中的城市高层建筑特征提取

郭睿1,臧博2(),彭树铭3,邢孟道2   

  1. 1.西北工业大学 自动化学院, 陕西 西安 710129
    2.西安电子科技大学 电子工程学院, 陕西 西安 710071
    3.958899部队, 北京 100085
  • 收稿日期:2019-01-21 出版日期:2019-08-20 发布日期:2019-08-15
  • 通讯作者: 臧博
  • 作者简介:郭 睿(1985—),女,讲师,E-mail: gr2003@nwpu.edu.cn;
  • 基金资助:
    国家自然科学基金(61701410);国家自然科学基金(61701374);国防科技卓越青年人才基金(2017-JCJQ-ZQ-061)

Extraction of features of the urban high-rise building from high resolution InSAR data

GUO Rui1,ZANG Bo2(),PENG Shuming3,XING Mengdao2   

  1. 1.School of Automation, Northwestern Polytechnical Univ., Xi’an 710129, China
    2.School of Electronic Engineering, Xidian Univ., Xi’an 710071, China
    3.Troops 95899, Beijing 100085, China
  • Received:2019-01-21 Online:2019-08-20 Published:2019-08-15
  • Contact: Bo ZANG

摘要:

在分米级超高分辨下,为先进干涉合成孔径雷达技术等提供先验信息,可以依据高层建筑在干涉合成孔径雷达图像中的投影有其独有的特性,对城市高层建筑进行更多细节信息的提取。因此提出一种基于图像、感兴趣区域、高层建筑、像素级别的从上至下逐步细化的处理方法,结合高层建筑在超高分辨干涉幅度、干涉系数及缠绕相位中的投影结构和特性,引出高层建筑的方向角和等高同向像素等特征定义,并实现对高层建筑检测及特征提取。采用德国TanDEM-X系统获得的城市高层区域侧视数据进行实验,验证了所提方法的有效性和可行性。

关键词: 超高分辨, 干涉合成孔径雷达, 高层建筑, 特征提取, 等高同向像素

Abstract:

Under decimeter resolution, the projection of an individual high-rise building shows its distinctive features in interferometric synthetic aperture radar (InSAR) images, which can help extract more accurate detail information and supply prior information for advanced interferometric techniques such as Tomography SAR (TomoSAR). In this paper, a top-to-down coarse-to fine approach is proposed to extract high-rise building features, which works at four different levels, namely, image-, region of interest (ROI)-, building- and pixel-wise processing, and which considers the analysis of high-rise building characteristics in very high resolution InSAR data pairs. Finally, the features of the high-rise building including the building orientation and pixels at the same height with the similar orientation are defined and estimated. The proposed approach is validated by using the single-pass interferogram from the TanDEM-X system over high-rise urban areas.

Key words: very high resolution, interferometric synthetic aperture radar, high-rise building, feature extraction, pixels in the same height with the similar orientation

中图分类号: 

  • TP959.3