基于LDO限流技术的辐射闩锁防护技术

基于LDO限流技术的辐射闩锁防护技术

张伟功1,2;蒋轩祥2;唐雪寒2;郝跃1

(1. 西安电子科技大学微电子研究所, 陕西西安 710071;
2. 中国航天时代电子公司771研究所, 陕西西安 710075)

收稿日期:1900-01-01 修回日期:1900-01-01 出版日期:2004-08-20 发布日期:2004-08-20

A technology for protection from latch-up based on current rejetion by LDO

ZHANG Gong-wei1,2;JIANG Xuan-xiang2;TANG Xue-han2;HAO Yue1

(1. Research Inst. of Microelectronics, Xidian Univ., Xi'an 710071, China;
2. No.771 Institue of CASC, Xi'an 710075, China)

Received:1900-01-01 Revised:1900-01-01 Online:2004-08-20 Published:2004-08-20

摘要/Abstract

摘要： 讨论了CMOS器件受辐射感生的闩锁与电气感生的闩锁的异同点，研究并提出了一种基于限流型低压降线性调整器的闩锁防护方法，给出了卫星用线性调整器电路的地面总剂量摸底试验数据及空间飞行试验验证结果和解决星载计算机的闩锁防护与恢复问题的有效方法．

关键词: 星载计算机, 空间辐射, 闩锁防护, 线性调整器

Abstract: This paper discusses the similarities and differences between the latch-up induced by electrics and the latch-up induced by radiation for CMOS IC's. A technical scheme for Latch-up protection based on current rejection by a low-dropout linear voltage regulator(LDO) is developed, with the onboard experimental result and the experimental data of TDO on ground of the LDO circuit used on the satellite given. Finally, the problem of protection and recovery from latch-up on the onboard-computer has been solved.

Key words: onboard computer, space radiation, protection from latch-up, linear voltage regulator

中图分类号:

TP338

张伟功1;2;蒋轩祥2;唐雪寒2;郝跃1. 基于LDO限流技术的辐射闩锁防护技术[J]. J4, 2004, 31(4): 565-568.

ZHANG Gong-wei1;2;JIANG Xuan-xiang2;TANG Xue-han2;HAO Yue1.

A technology for protection from latch-up based on current rejetion by LDO

[J]. J4, 2004, 31(4): 565-568.