MOSFET辐照损伤1/f噪声产生机制的定量鉴别方法

李伟华;杜磊;包军林;马中发

Quantitative identification method for the ionizing radiation induced 1/f noise in MOSFETs

LI Weihua;DU Lei;BAO Junlin;MA Zhongfa

J4 . 2011, (4): 6 -10+48 . DOI: 10.3969/j.issn.1001-2400.2011.04.002