J4 ›› 2013, Vol. 40 ›› Issue (6): 147-154.doi: 10.3969/j.issn.1001-2400.2013.06.025

• Original Articles • Previous Articles     Next Articles

Method of moment investigation on electromagnetic scattering  from the three-layered rough interfaces

ZHANG Lianbo;GUO Lixin;GOU Xueyin;WANG Anqi   

  1. (School of Science, Xidian Univ., Xi'an  710071, China)
  • Received:2013-04-07 Online:2013-12-20 Published:2014-01-10
  • Contact: ZHANG Lianbo E-mail:lianbozhang@163.com

Abstract:

The properties of electromagnetic(EM) scattering from a multi-layered rough surfaces have been investigated through the method of moments(MOM) with the pulse basis function and the point matching technique. Theoretical formulas such as integral equations, matrix equations, and the definition of the bistatic scattering coefficient of this scattering problem have been derived in detail. The Gaussian rough surface has been applied to simulate the realistic surface by the Monte Carlo method. Firstly, the validity of the presented method has been shown by comparing with the finite difference time domain(FDTD). The versatility of the presented method has been demonstrated by degenerating the three-layered rough interfaces to a single-layered rough interface and then comparing with the exit scattering model. Finally, the influences of the characteristic parameters such as incident angle, relative permittivity of the medium, root mean square height and correlation length, as well as the height of each rough surface on the bistatic scattering coefficient are discussed in detail.

Key words: method of moment, three-layered rough interfaces, electromagnetic scattering

CLC Number: 

  • O441.4