Abstract: The coupling effect induced by capacitance has become a key factor in VLSI design, as taller and narrower wires are now placed closer to each other. In this paper, we apply the L model for coupling interconnects and present an analytical expression for coupling noise based on dominant-pole approximation. The factors affecting peak noise are discussed. Compared with the methods available, the model is simplified without lowering accuracy. It can be used in noise-aware layout optimization.

Key words: interconnect coupling noise, dominant-pole approximation, sensitivity