Abstract: Based on the need for the method to improve the IC's integrated profit, a novel layer yield optimal model is presented. Firstly, an integrated performance function is formulated. Secondly, accoring to the integrated performance function, all factors, such as designable parameters, the number of layers and layered parameters, are considered together to establish the optimal model. Thirdly a special algorithm is designed for this model with efficient sampling technology--Uniform Design. Finally, encouraging results have been obtained thus far, with numerical and circuit examples given to demonstrate the model.

Key words: integrated value method, layer yield, optimal model, designable domain, uniform design