Modeling and calculating of interconnect delay by considering the influence of inductance effect and process fluctuations
YANG Yang;CHAI Chang-chun;DONG Gang;YANG Yin-tang;LENG Peng
J4 . 2010, (3): 513 -519 .  DOI: 10.3969/j.issn.1001-2400.2010.03.023

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