RF build-in self-test and key measurement processing for the low-cost system-on-chip
ZHU Jia;LIU Hongxia
Journal of Xidian University . 2017, (4): 29 -33 .  DOI: 10.3969/j.issn.1001-2400.2017.04.006

Copyright © 2018 Journal of Xidian University, All Rights Reserved.
Powered by Beijing Magtech Co. Ltd