[1] 龚自立, 贾新章, 白永亮. 元器件质量与可靠性数据统计分布规律的拟合[J]. 西安电子科技大学学报, 2001, 28(3): 336-339.
Gong Zili, Jia Xinzhang, Bai Yongliang. The Distribution Fitting for the Testing Data of Electronic Parts[J]. Journal of Xidian University, 2001, 28(3): 336-339.
[2] 闵军, 张海呈, 朱桂斌. 自组网可靠性评价方法 [J]. 电子科技大学学报, 2008, 37(5): 436-438.
Min Jun, Zhang Haicheng, Zhu Guibin. Reliability Evaluating Method of Ad Hoc Network [J]. Journal of University of Electronic Science and Technology of China, 2008, 37(5): 436-438.
[3] 刘宏伟, 杨孝宗, 曲峰, 等. 非齐次泊松过程类软件可靠性增长模型[J]. 同济大学学报, 2004, 32(8): 1071-1074.
Liu Hongwei, Yang Xiaozong, Qu Feng, et al. Software Reliability Growth Models of Non-homogeneous Poisson Process [J]. Journal of Tongji University, 2004, 32(8): 1071-1074.
[4] 严拴航, 师义民. 恒应力加速寿命试验中的无失效数据的处理[J]. 纯粹数学与应用数学, 2006, 22(2): 145-148.
Yan Shuanhang, Shi Yimin. Zero-failure Data Process of Constant Stress Accelerated Life Testing[J]. Pure and Applied Mathematics, 2006, 22(2): 145-148.
[5] Martz H F, Waller R A. A Bayesian Zero-failure(baze) Reliability Demonstration Testing Procedure[J]. Journal of Quality Technology, 1979, 11(3): 128-137.
[6] 林虎, 郭树旭, 赵蔚, 等. 小波变换用于半导体激光器可靠性分析[J]. 中国激光, 2004, 31(9): 1050-1054.
Lin Hu, Guo Shuxun, Zhao Wei, et al. Wavelet Transform for Evaluation of Semiconductor Laser Reliability[J]. Chinese Journal of Lasers, 2004, 31(9): 1050-1054.
[7] 杨之昌, 马秀芳. 长寿命He-Ne激光器的加速寿命试验[J]. 中国激光, 1989, 16(7): 410-412.
Yang Zhichang, Ma Xiufang. Accderated Life Test for Long-life He-Ne Laser[J]. Chinese Journal of Lasers, 1989, 16(7): 410-412.
[8] 王喜山, 孙振东. 用威布尔函数研究氦-氖激光管的寿命特性[J]. 中国激光, 1987, 14(4): 213-215.
Wang Xishan, Sun Zhendong. Study He-Ne Characteristics Lifetime with Weibull Function [J]. Chinese Journal of Lasers, 1987, 14(4): 213-215. |