一种估算微带传输线辐射敏感性的解析电路模型

doi:10.3969/j.issn.1001-2400.2017.05.017

Abstract

Abstract:

According to transmission line theory and electromagnetic theory, a time-domain analytic circuit model for radiated susceptibility estimation of a microstrip transmission line is proposed. In order to obtain the susceptibility threshold of a microstrip line under external electromagnetic interference quickly, a transverse electromagnetic cell (due to IEC standard 62132-2) is adopted as the test environment. A transmission line pulse is chosen as the external electromagnetic interference, since its steep edges can directly demonstrate radiated susceptibility of a microstrip line. This is an application case to identify the availability of the model. Specific parameters of the analytic circuit model are derived and comparisons of calculated and measured results of transmission line pulse responses for the matched microstrip line confirm the accuracy of the model. Furthermore, transmission line pulse responses of a microstrip transmission line with arbitrary loads and contributions of electric and magnetic field couplings are calculated. The effect of terminal load on the response of a microstrip transmission line is obtained, which can be helpful for load-selection to improve radiated susceptibility estimation of a microstrip transmission line.

Key words: analytic circuit model, radiated susceptibility, transmission line pulse, microstrip transmission line

SHI Chunlei;CHAI Changchun;LIU Yuqian;FAN Qingyang;LIU Yang;YANG Yintang. Analytic circuit model for radiated susceptibility estimation of the microstrip transmission line[J].Journal of Xidian University, 2017, 44(5): 97-101.

References

［1］路宏敏, 吴保义, 姚志成, 等. 微带线直角弯曲最佳斜切率研究［J］. 西安电子科技大学学报, 2009, 36(5): 885-889.
LU Hongmin, WU Baoyi, YAO Zhicheng, et al. Research on the Optimal Percentage Miter of the Microstrip Right Angle Bend［J］. Jounal of Xidian University, 2009, 36(5): 885-889.
［2］ SHI C L, FANG W X, CHAI C C, et al. Using Termination Effect to Characterize Electric and Magnetic Field Coupling Between TEM Cell and Microstrip Line［J］. IEEE Transactions on Electromagnetic Compatibility, 2015, 57(6): 1338-1344.
［3］ MANDIC T, VANHEE F, GILLON R, et al. Equivalent Circuit Model of the TEM Cell Electric and Magnetic Field Coupling to Microstrip Lines［C］//Proceedings of the 2009 16th IEEE International Conference on Electronics, Circuits, and Systems. Piscataway: IEEE, 2009: 247-250.
［4］ MANDIC T, GILLON R, NAUWELAERS B, et al. Characterizing the TEM Cell Electric and Magnetic Field Coupling to PCB Transmission Lines［J］. IEEE Transactions on Electromagnetic Compatibility, 2012, 54(5): 976-985.
［5］ LAND S O, RAMDANI M, PERDRIAU R, et al. Using a Modified Taylor Cell to Validate Simulation and Measurement of Field-to-shorted-trace Coupling［J］. IEEE Transactions on Electromagnetic Compatibility, 2014, 56(4): 864-870.
［6］ LAND S O, RAMDANI M, PERDRIAU R, et al. Field-to-long-segmented-trace Coupling with Arbitrary Loads and a Transparent Upper Bound Using a Single Modified Taylor Cell［J］. IEEE Transactions on Electromagnetic Compatibility, 2016, 58(5): 1517-1525.
［7］ MANDIC T, PEJCINOVIC B, BARIC A. Comparison of Simulation and Measurements of Time-domain Field-to-line Coupling in TEM Cell［C］// Proceedings of the IEEE International Symposium on Electromagnetic Compatibility. Piscataway: IEEE, 2014: 681-685.
［8］ AYED A, LAND S O, PERDRIAU R, et al. FastImmunity: an EDA Extension for PCB Immunity Prediction［C］//Proceedings of the 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility. Piscataway: IEEE, 2016: 207-210.
［9］ LAGOS J L, FIORI F. Worst-case Induced Disturbances in Digital and Analog Interchip Interconnects by an External Electromagnetic Plane Wave—Part Ⅰ: Modeling and Algorithm［J］. IEEE Transactions on Electromagnetic Compatibility, 2011, 53(1): 178-184.
［10］ MAGDOWSKI M, VICK R. Closed-form Formulas for the Stochastic Electromagnetic Field Coupling to a Transmission Line with Arbitrary Loads［J］. IEEE Transactions on Electromagnetic Compatibility, 2012, 54(5): 1147-1152.

Analytic circuit model for radiated susceptibility estimation of the microstrip transmission line

PDF (PC)

Like

Knowledge

Abstract

Cite this article

share this article

References

Related Articles 0

Metrics

Comments

Recommended 10