[1] BOUDALI H, CROUZEN P, STOELINGA M. A Rigorous, Compositional, and Extensible Framework for Dynamic Fault Tree Analysis[J]. IEEE Transactions on Dependable and Secure Computing, 2010, 7(2): 128-143.
[2] RAMEZANI Z, LATIF-SHABGAHI G R, KHAJEIE P, et al. Hierarchical Steady-state Availability Evaluation of Dynamic Fault Trees through Equal Markov Model[C]//Proceedings of the 2016 24th Iranian Conference on Electrical Engineering. Piscataway: IEEE, 2016: 1848-1854.
[3] ZHANG P, CHAN K W. Reliability Evaluation of Phasor Measurement Unit Using Monte Carlo Dynamic Fault Tree Method[J]. IEEE Transactions on Smart Grid, 2012, 3(3): 1235-1243.
[4] MO Y C. New Insights into the Binary Decision Diagram-based Reliability Analysis of Phased-mission Systems[J]. IEEE Transactions on Reliability, 2009, 58(4): 667-678.
[5] MURTHY C, MISHRA A, GHOSH D, et al. Reliability Analysis of Phasor Measurement Unit Using Hidden Markov Model[J]. IEEE Systems Journal, 2014, 8(4): 1293-1301.
[6] DRECHSLE R. Evaluation of Static Variable Ordering Heuristics for MDD Construction[C]//Proceedings of the International Symposium on Multiple-valued Logic. Piscataway: IEEE, 2002: 254-260.
[7] MO Y C. A Multiple-valued Decision-diagram-based Approach to Solve Dynamic Fault Trees[J]. IEEE Transactions on Reliability, 2014, 63(1): 81-93.
[8] LIN Y H, LI Y F, ZIO E. A Reliability Assessment Framework for Systems with Degradation Dependency by Combining Binary Decision Diagrams and Monte Carlo Simulation[J]. IEEE Transactions on Systems, Man, and Cybernetics: Systems, 2016, 46(11): 1556-1564.
[9] LE M, WEIDENDORFER J, WALTER M. A Novel Variable Ordering Heuristic for BDD-based K-terminal Reliability[C]//Proceedings of the International Conference on Dependable Systems and Networks. Piscataway: IEEE, 2014: 527-537.
[10] YEVKIN O. An Improved Modular Approach for Dynamic Fault Tree Analysis[C]//Proceedings of the Annual Reliability and Maintainability Symposium. Piscataway: IEEE, 2011: 5754437.
[11] HARDY G, LUCET C, LIMNIOS N. K-terminal Network Reliability Measures with Binary Decision Diagrams[J]. IEEE Transactions on Reliability, 2007, 56(3): 506-515. |