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Simulation and analysis of high frequency small-signal characteristics for 4H-SiC MESFETs

WANG Lei;ZHANG Yi-men;ZHANG Yu-ming;SHENG Li-zhi

  

  1. (Research Inst. of Microelectronics, Xidian Univ., Xi'an 710071, China)
  • Received:1900-01-01 Revised:1900-01-01 Online:2004-12-20 Published:2004-12-20

Abstract: Small-signal high frequency characteristics of 4H-SiC MESFETs have been studied with the two-dimensional device simulator MEDICI based on the operation model of 4H-SiC MESFETs developed in this paper. The simulation results using teh sinusoidal steady-state analysis approach agree well with the experimental data within the cut-off frequency. Also, the effects of the gate length, gate-to-drain spacer distances, inpruity concentration and lemperature on the high frequency characteristic of SiC MESFETs have been studied based on the presented model.

Key words: 4H-SiC, MESFET, high frequency small-signal, cut-off frequency

CLC Number: 

  • TN303