Simulation and analysis of high frequency small-signal characteristics for 4H-SiC MESFETs
J4
• Original Articles • Previous Articles Next Articles
WANG Lei;ZHANG Yi-men;ZHANG Yu-ming;SHENG Li-zhi
Received:
Revised:
Online:
Published:
Abstract: Small-signal high frequency characteristics of 4H-SiC MESFETs have been studied with the two-dimensional device simulator MEDICI based on the operation model of 4H-SiC MESFETs developed in this paper. The simulation results using teh sinusoidal steady-state analysis approach agree well with the experimental data within the cut-off frequency. Also, the effects of the gate length, gate-to-drain spacer distances, inpruity concentration and lemperature on the high frequency characteristic of SiC MESFETs have been studied based on the presented model.
Key words: 4H-SiC, MESFET, high frequency small-signal, cut-off frequency
CLC Number:
WANG Lei;ZHANG Yi-men;ZHANG Yu-ming;SHENG Li-zhi.
0 / / Recommend
Add to citation manager EndNote|Reference Manager|ProCite|BibTeX|RefWorks
URL: https://journal.xidian.edu.cn/xdxb/EN/
https://journal.xidian.edu.cn/xdxb/EN/Y2004/V31/I6/825
Analytical model for the electron Hall mobility in th n-type 4H-SiC
Analysis of the frequency property in SiGe HBT
Cited