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中文
Measurement of doping concentration in strained Si
1-x
Ge
x
with four-probe array
DAI Xian-ying1;WANG Wei1;ZHANG He-ming1;HE Lin2;ZHANG Jing2;HU Hui-yong1;Lü Yi1
J4 . 2003, (
2
): 255 -258 .
