TMR+Scrubbing SRAM加固型FPGA辐照实验研究

›› 2013, Vol. 26 ›› Issue (10): 139-.

TMR+Scrubbing SRAM加固型FPGA辐照实验研究

孙野,陈晖照

(山东航天电子技术研究所通信事业部,山东烟台 264003)

出版日期:2013-10-15 发布日期:2013-10-23
作者简介:孙野(1986—),男,硕士研究生。研究方向:测控通信,抗空间辐射加固技术。E-mail:sunye0302@126.com

Study on SEE Experiment of TMR+Scrubbing SRAM FPGA

SUN Ye,CHEN Huizhao

(Communications Division,Shandong Institute of Aerospace Electronic Technology,Yantai 264003,China)

Online:2013-10-15 Published:2013-10-23

摘要/Abstract

摘要：

针对卫星平台和载荷对大规模集成电路的依赖性越来越强,尤其是SRAM型FPGA。作为信号处理核心器件,FPGA的单粒子效应备受关注。文中研究了三模冗余和动态刷新两种加固方法,并进行重粒子试验验证,采用不同能量的粒子以对照实验的方式验证了加固方法的有效性,试验结果显示,文中设计的加固方法可以提高抗单粒子性能2倍以上。

关键词: 三模冗余, 动态刷新, SRAM FPGA

Abstract:

Satellite platform and payload are becoming increasingly dependent on the VLSI,especially on FPGA.As a signal processing core device,FPGA's SEE is concerned.In this paper,the two reinforcement methods of TMR and scrubbing are studied and verified by experiments.The use of different energy particles verifies the effectiveness of the method.The method can improve more than twice the performance of FPGA anti single particle according to the test results.

Key words: TMR;scrubbing;SRAM FPGA

中图分类号:

TN79

孙野,陈晖照. TMR+Scrubbing SRAM加固型FPGA辐照实验研究[J]. , 2013, 26(10): 139-.

SUN Ye,CHEN Huizhao. Study on SEE Experiment of TMR+Scrubbing SRAM FPGA[J]. , 2013, 26(10): 139-.