单粒子效应加固及仿真验证技术研究

›› 2013, Vol. 26 ›› Issue (11): 89-.

单粒子效应加固及仿真验证技术研究

孙野,房志刚,陈晖照,黄维,张举

(1.山东航天电子技术研究所通信事业部,山东烟台 264003;2.东北农业大学,黑龙江哈尔滨 150030)

出版日期:2013-11-15 发布日期:2013-11-19
作者简介:孙野(1986—),男,硕士研究生。研究方向:测控通信,抗空间辐射加固技术。E-mail:sunye0302@126.com

Study on Single Event Effects and Simulation Technology

SUN Ye,FANG Zhigang,CHEN Huizhao,HUANG Wei,ZHANG Ju

(1.Department of Communications Services,Shandong Aerospace Electronic Technology Institute,Yantai 264003,China;2.Northeast Agricultural University,Harbin 150030,China)

Online:2013-11-15 Published:2013-11-19

摘要/Abstract

摘要：

作为星载设备信号处理核心器件,SRAM FPGA的单粒子效应加固及加固方法验证始终备受关注。文中研究了三模冗余和动态刷新两种加固方法,并设计了故障仿真验证方法,试验应用故障注入技术,采用比对方法,成功对加固方法进行了验证。试验结果显示,文中设计的加固方法可提高抗单粒子性能。

关键词: 三模冗余, 动态刷新, 单粒子效应

Abstract:

As the important signal processing devices in the satellite,SRAM FPGA single event effects radiation-hardened and radiation-hardened validation have been receiving constant attention.This paper studies the two radiation hardening methods of triple modular redundancy and dynamic refresh,and designs a fault injection simulation.The radiation-hardened method is validated successfully,and the results show that the proposed reinforcement method can improve the performance of the anti-single-particle.

Key words: TMR;scrubbing;single event effects

中图分类号:

TN79

孙野,房志刚,陈晖照,黄维,张举. 单粒子效应加固及仿真验证技术研究[J]. , 2013, 26(11): 89-.

SUN Ye,FANG Zhigang,CHEN Huizhao,HUANG Wei,ZHANG Ju. Study on Single Event Effects and Simulation Technology[J]. , 2013, 26(11): 89-.

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[2]	梁永生, 吴郁, 郑宏超, 李哲. 65 nm体硅工艺NMOS中单粒子多瞬态效应的研究[J]. , 2018, 31(1): 12-.
[3]	孙野,陈晖照. TMR+Scrubbing SRAM加固型FPGA辐照实验研究[J]. , 2013, 26(10): 139-.