关键词: 测量头, 调理电路, 可编程控制, 数据采集读取, 测试实验

Abstract:

Based on a large scanning LVDT inductive probe integrated noise shortcomings, the measurement accuracy of the end, this paper presents a high flexibility and programmability of scanning integrated inductive LVDT probe conditioning circuit. The use of synchronous demodulator and ADA2200 analog filter in the analog domain to extract the location information and suppress noise analog circuits, MCU through the internal integration of high-speed, high-precision 16-bit A / D converters, and other functional modules of C8051F060 conditioning circuit programmable control and data acquisition read. Finally, the development of the circuit has been tested and experimental results achieved expectations.

Key words: probe;programmable control;programmable control;data acquisition read;testing laboratory