应变Si NMOS器件总剂量辐射对单粒子效应的影响

张倩,郝敏如

Single Event Effect Under Total Dose Radiation in Strained Si NMOS Devices

ZHANG Qian,HAO Minru

电子科技 . 2019, (6): 22 -26 . DOI: 10.16180/j.cnki.issn1007-7820.2019.06.005