Electronic Science and Technology ›› 2024, Vol. 37 ›› Issue (5): 62-70.doi: 10.16180/j.cnki.issn1007-7820.2024.05.009

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Surface Defect Detection of Transparent Objects Based on Phase Measuring Deflectometry

DING Yujie1, ZHOU Zhifeng1, WANG Yong2, WANG Lirui3   

  1. 1. School of Mechanical and Automotive Engineering,Shanghai University of Engineering Science, Shanghai 201620,China
    2. State Grid Siji Location Service Co.,Ltd.,Bejing 102200,China
    3. Comnav Technology Co.,Ltd.,Shanghai 201620,China
  • Received:2022-12-13 Online:2024-05-15 Published:2024-05-21
  • Supported by:
    Sponsored by Program of ShanghaiAcademic/Technology Research Leader(22XD1433500)

Abstract:

At present,the traditional method is still used to control the quality of glass,lens and other transparent objects in China,and the traditional visual evaluation method is inefficient.In order to realize automatic detection of surface defects of transparent objects,a transmission detection method based on PMD(Phase Measuring Deflectometry) is proposed.The structure light fringe pattern is generated by PMD algorithm combined with the new phase shift pattern generation formula,and the fringe pattern is projected to the surface of the measured object using the transmission system. The distorted fringe image after refraction of the measured object is collected by the camera,then the absolute phase diagrams are generated, and the defects are extracted by identifying the local distortion in the absolute phase diagram.Through analyzing the reason of false detection caused by periodic misalignment,a method of correcting absolute phase periodic misalignment is proposed. The new formula of phase shift pattern generation can also correct periodic misalignment in advance,the combination of the two methods can improve the precision of phase unwrapping. A concave and convex lens with a focal length of 300 mm is taken as an example, the experimental results show that the proposed method can accurately extract the local distortion in the absolute phase diagram caused by surface defects with an accuracy of 0.1 mm.

Key words: transparent object, automatic detection of surface defects, phase measuring deflectometry, structured light stripe pattern, transmission system, phase unfolding, local distortion, misalignment of periods

CLC Number: 

  • TP391