J4 ›› 2012, Vol. 39 ›› Issue (3): 86-89+105.doi: 10.3969/j.issn.1001-2400.2012.03.013

• Original Articles • Previous Articles     Next Articles

Scattering rates of electrons in strained Si1-xGex (100)

ZHAO Lixia;ZHANG Heming;XUAN Rongxi;HU Huiyong   

  1. (Ministry of Education Key Lab. of Wide Band-Gap Semiconductor Materials and  Devices, Xidian Univ., Xi'an  710071, China)
  • Received:2011-03-03 Online:2012-06-20 Published:2012-07-03
  • Contact: ZHAO Lixia E-mail:zhaolixia@poshing.cn

Abstract:

Based on Fermi's golden rule and the theory of Boltzmann collision term approximation, scattering rates of electrons in strained Si1-xGex /(100)Si is studied, including the ionized impurity, acoustic phonon, intervalley phonon and alloy disorder scattering rates. It is found that scattering rates of acoustic phonons and f2 and f3 intervalley phonons decrease obviously under strain. One of the two factors which lead to the electron mobility enhancement in Si-based strained materials is the electron scattering rate.

Key words: strained Si1-xGex , electron, scattering

CLC Number: 

  • TN432