›› 2011, Vol. 24 ›› Issue (6): 34-.

• 论文 • 上一篇    下一篇

基于FPGA的NAND Flash ECC校验

吕小微   

  1. (西安电子科技大学 电子工程学院,陕西 西安 710071)
  • 出版日期:2011-06-15 发布日期:2011-06-14
  • 作者简介:吕小微(1986—),女,硕士研究生。研究方向:模式识别与智能系统。

NAND Flash ECC Check-Out Based on FPGA

LV Xiaowei   

  1. (School of Electronic Engineering,Xidian University,Xi'an 710071,China)
  • Online:2011-06-15 Published:2011-06-14

摘要:

基于Flash存储器的Hamming编码原理,在Altera Quartus II 7.0开发环境下,实现ECC校验功能。测试结果表明,该程序可实现每256 Byte数据生成3 Byte的ECC校验数据,能够检测出1 bit错误和2 bit错误,对于1 bit错误还能找出其出错位置并予以纠正,可应用于NAND Flash 读写控制器的FPGA设计,保证数据传输的可靠性。

关键词: ECC校验;FPGA;NAND Flash;读写控制器

Abstract:

ECC checkout is achieved based on hamming encoder in Altera Quartus II 7.0 environment.Experimental results show this procedure realizes each 256 bytes born 3 bytes ECC check-out data.Moreover,it can not only ensure single-bit and double-bit detection,but also locate the error and correct it,which can be applied to FPGA design of Read-Write Controller to realize the ECC check-out and guarantee reliability of data transmission.

Key words: ECC check-out;FPGA;NAND Flash;read-write controller

中图分类号: 

  • TN79