›› 2011, Vol. 24 ›› Issue (9): 91-.

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  1. (西安工业大学 电子信息工程学院,陕西 西安 710032)
  • 出版日期:2011-09-15 发布日期:2011-10-24
  • 作者简介:白雨(1985—),男,硕士研究生。研究方向:通信与信息处理。程光伟(1957—),男,副教授。研究方向:通信与电子信息。

Arc Fitting Technology for Crystalloids Growth Detection System Based on LabVIEW

 BAI Yu, CHENG Guang-Wei   

  1. (School of Electronic and Information Engineering,Xi'an Technological University,Xi'an 710032,China)
  • Online:2011-09-15 Published:2011-10-24



关键词: LabVIEW, 最小二乘法, 圆弧拟合


In the crystalloids growth detecting system based on LabVIEW,according to the growth features of monocrystalline silicon and the principle of least square method fictions,the image processing is done on collected monocrystalline silicon growth information by adopting graphic programming languages,during which spline curve fitting is applied to some of the "ptroelectric rings".Therefore,the diameter of the crystalloids growth is able to be detected via the Arc fit.This experiment exhibits that such a rigorous design is capable of the spline curve fitting function,and can detect the diameter of the crystalliods growth of monocrystalline silicon,and thus meeting all requirements of detecting system.

Key words: LabVIEW;least square method;arc fit


  • TN304