›› 2015, Vol. 28 ›› Issue (9): 63-.

• 论文 • 上一篇    下一篇

NoC边界扫描测试系统硬件设计

全钊锋   

  1. (桂林电子科技大学 电子工程与自动化学院,广西 桂林 541004)
  • 出版日期:2015-09-15 发布日期:2015-09-15
  • 作者简介:全钊锋(1987—),男,硕士研究生。研究方向:集成电路设计。E-mail:602345825@qq.com

Hardware Design of NoC Boundary Scan Test System

QUAN Zhaofeng   

  1. (School of Electronic Engineering and Automatic,Guilin University of Electronic Technology,Guilin 541004,China)
  • Online:2015-09-15 Published:2015-09-15

摘要:

为了解决内部结构日益复杂的片上网络系统故障测试的问题,在研究3×3 2D-Mesh体系结构的NoC系统、边界扫描测试技术和资源节点故障类型的基础上,以FPGA为核心器件设计边界扫描测试系统。完成了数据采集、频率计、放大器、SRAM、IEEE1500 Wrapper等资源节点电路以及资源节点边界扫描链路的接口电路设计,并利用测试软件、信号发生器、万用表和数字示波器,通过边界扫描链路完成对整个硬件设计的测试。测试结果表明该设计性能稳定,为研究NoC系统的边界扫描测试技术提供了硬件平台。

关键词: 片上网络, FPGA, 边界扫描, 硬件平台

Abstract:

A boundary scan test system is designed with FPGA as the core for fault testing of complex network on chip systems based on 3×3 2D-Mesh structure of NoC system,the boundary scan test technology and the resource node fault types.The frequency meter,amplifier,SRAM,IEEE1500 Wrapper and the boundary scanning chains of resource nodes interface are implemented.The test software,signal generator,AVO meter,digital oscilloscope are used to checkout the whole hardware design through boundary chain.The test results show that the design offers stable performance and provides a hardware platform of boundary scan test in the research of NoC systems.

Key words: network on chip;FPGA;boundary scan;hardware platform

中图分类号: 

  • TN47