关键词: 模型电路可靠性, 老化效应, 负偏压温度不稳定性, 输入向量控制, 泄露功耗

Abstract:

When the characteristic size of the transistor is reduced to 45 nm, the reliability of the circuit has become a key factor affecting system design, the main cause of circuit reliability caused by negative bias temperature instability (NBTI) and leakage power consumption, resulting in The aging of the key door is aggravated, and the critical path delay is increased, which eventually causes the chip to fail and affects the normal operation of the system. In order to alleviate the influence of NBTI effect and leakage power on circuit reliability and extend the service life of the circuit, this paper proposed a cyclic vector method for collaborative optimization. In the ISCAS85 reference circuit, used the method of this paper to optimize the experiment, the average delay of NBTI effect was relatively improved at 10%, the leakage power consumption was reduced by an average of 15%, which proved the feasibility of the cyclic vector method.

Key words: circuit reliability, aging effect, negative bias temperature instability, input vector control, leakage power consumption