[1] |
Morgan K. SEU-induced persistent error propagation in FPGAs[J]. IEEE Transactions on Nuclear Science, 2005,52(6):2438-2445.
|
[2] |
山蕊, 李涛, 蒋林. 动态可重构阵列处理器数据流处理单元的设计和实现[J]. 微电子学与计算机, 2017,34(1):106-109.
|
|
Shan Rui, Li Tao, Jiang Lin. Design and implementation of data stream processing unit for dynamic reconfigurable array processor[J]. Microelectronics & Computer, 2017,34(1):106-109.
|
[3] |
李浩洋, 宋宇鲲. 一种支持多种工作模式的可重构计算单元的设计[J]. 微电子学与计算机, 2017,34(10):53-58.
|
|
Li Haoyang, Song Yukun. Design of a reconfigurable computing unit supporting multiple working modes[J]. Microelectronics & Computer, 2017,34(10):53-58.
|
[4] |
谭龙生, 梁华国, 王存. 一种用于嵌入式软核的动态可重构容错方案[J]. 合肥工业大学学报, 2015,38(11):1052-1057.
|
|
Tan Longsheng, Liang Huaguo, Wang Cun. A dynamic reconfigurable fault tolerant scheme for embedded soft cores[J]. Journal of Hefei University of Technology, 2015,38(11):1052-1057.
|
[5] |
邱根, 毕东杰, 彭礼彪. 一种应用于SRAM型FPGA寄存器的容错设计[J]. 中国测试, 2018,44(9):75-79.
|
|
Qiu Gen, Bi Dongjie, Peng Libiao. A fault tolerant design for SRAM type FPGA registers[J]. China Testing, 2018,44(9):75-79.
|
[6] |
孙野, 陈晖照. TMR + Scrubbing SRAM加固型FPGA辐照实验研究[J]. 电子科技, 2013,26(10):139-141.
|
|
Sun Ye, Chen Huizhao. Study on SEE experiment of TMR + Scrubbing SRAM FPGA[J]. Electronic Science and Tecgnology, 2013,26(10):139-141.
|
[7] |
刘光辉. 使用时间冗余保证处理器的可靠性[J]. 计算机工程与应用, 2011,47(21):17-22.
|
|
Liu Guanghui. Using time redundancy to ensure processor reliability[J]. Computer Engineering and Applications, 2011,47(21):17-22.
|
[8] |
Abate F. New technique for improving the performance of lockstep architecture for SEEs mitigation in FPGA embedded processors[J]. IEEE Transactions on Nuclear Science, 2009,56(4):1992-2000.
|
[9] |
Wang Jing, Yang Xing, Zhao Yuanfu, et al. Multi-bits error detection and fast recovery in RICS core[J].Journal of Semiconductors, 2016, 36(11): 115009(1-8).
|
[10] |
Ichinomiya Y. Improving the robustness of a softcore processor against SEUs by using TMR and partial reconfiguration[C].Charlotte:IEEE Annual International Symposium on Field-Programmable Custom Computing Machines, 2010.
|
[11] |
王晶, 申娇, 丁利华, 等. 基于周期粒度的级间寄存器备份机制[J]. 电子学报, 2018,46(10):2486-2494.
|
|
Wang Jing, Shen Jiao, Ding Lihua, et al. Inter-stage register backup mechanism based on periodic granularity[J]. Chinese Journal of Electronics, 2018,46(10):2486-2494.
|
[12] |
郝亚男, 高欣, 许仕龙. SRAM型FPGA的SEU容错技术研究[J]. 中国集成电路, 2015,10(5):31-36.
|
|
Hao Yanan, Gao Xin, Xu Shilong. Study on the SEU tolerant techniques for SRAM-based FPGAs[J]. China Integrated Circuit, 2015,10(5):31-36.
|
[13] |
薛芸男, 李振, 蒋承翔, 等. 面向航空环境的多时钟单粒子翻转故障注入方法[J]. 电子与信息学报, 2014,86(6):1504-1508.
|
|
Xue Yunan, Li Zhen, Jiang Chengxiang, et al. Multi-clock single-event fault injection method for aviation environment[J]. Journal of Electronics & Information Technology, 2014,86(6):1504-1508.
|
[14] |
Wang Yongqing, Ma Yuanxing, Liu Donglei, et al. An SEU tolerant approach for space-borne Viterbi decoders[J]. Chinese Journal of Electronics, 2014,24(3):857-861.
|
[15] |
Esteve Hoyos S, Evans H D, Daly E. From satellite lon flux data to SEU rata estimation[J]. IEEE Transaction on Nuclear Science, 2004,5(51):2927-2935.
|
[16] |
于航, 王晶, 周继芹, 等. 面向单粒子翻转效应的模拟故障注入技术[J]. 计算机工程与设计, 2016,37(1):107-111.
|
|
Yu Hang, Wang Jing, Zhou Jiqin, et al. Simulation fault injection technique for single event flipping effect[J]. Computer Engineering and Design, 2016,37(1):107-111.
|