›› 2010, Vol. 23 ›› Issue (9): 71-.

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Influence of the Thickness of the Ferroelectric Thin Film on its Phase Transition Properties

 YOU Na, ZHANG Xian-Jun, WANG Sheng-Peng   

  1. (1.School of Science,Xidian University,Xi'an 710071,China;2.School of Microelectrics,Xidian University,Xi'an 710071,China;3.General Staff Department,Jinan Agency of the Communication Ministry,Jinan 250014,China)
  • Online:2010-09-15 Published:2011-03-11

Abstract:

In the change of the thickness of the ferroelectric thin film,a study is made of the properties of phase transition of the ferroelectric thin film based on the transverse field Ising model using the framework of the mean field approximation.A calculation of the phase diagrams and polarizations as well as the Curie temperature of the ferroelectric thin film with different thickness is made by numerical method.Results show that the thickness has sensitive effect on the phase diagrams and the polarizations.However,it has not effect on the Curie temperature.

Key words: ferroelectric thin film;transverse Ising model;phase diagrams;Curie temperature

CLC Number: 

  • TN102