单粒子效应加固及仿真验证技术研究

Abstract

Abstract:

As the important signal processing devices in the satellite,SRAM FPGA single event effects radiation-hardened and radiation-hardened validation have been receiving constant attention.This paper studies the two radiation hardening methods of triple modular redundancy and dynamic refresh,and designs a fault injection simulation.The radiation-hardened method is validated successfully,and the results show that the proposed reinforcement method can improve the performance of the anti-single-particle.

Key words: TMR;scrubbing;single event effects

CLC Number:

TN79

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SUN Ye,FANG Zhigang,CHEN Huizhao,HUANG Wei,ZHANG Ju. Study on Single Event Effects and Simulation Technology[J]., 2013, 26(11): 89-.

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URL: https://journal.xidian.edu.cn/dzkj/EN/

https://journal.xidian.edu.cn/dzkj/EN/Y2013/V26/I11/89

References

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