›› 2013, Vol. 26 ›› Issue (11): 89-.

• Articles • Previous Articles     Next Articles

Study on Single Event Effects and Simulation Technology

SUN Ye,FANG Zhigang,CHEN Huizhao,HUANG Wei,ZHANG Ju   

  1. (1.Department of Communications Services,Shandong Aerospace Electronic Technology Institute,Yantai 264003,China;2.Northeast Agricultural University,Harbin 150030,China)
  • Online:2013-11-15 Published:2013-11-19


As the important signal processing devices in the satellite,SRAM FPGA single event effects radiation-hardened and radiation-hardened validation have been receiving constant attention.This paper studies the two radiation hardening methods of triple modular redundancy and dynamic refresh,and designs a fault injection simulation.The radiation-hardened method is validated successfully,and the results show that the proposed reinforcement method can improve the performance of the anti-single-particle.

Key words: TMR;scrubbing;single event effects

CLC Number: 

  • TN79