›› 2014, Vol. 27 ›› Issue (4): 69-.

• 论文 • 上一篇    下一篇

热载流子效应对CCD片上放大器寿命的影响

汪凌,唐利,廖晓航,任利平   

  1. (重庆光电技术研究所 第1研究室,重庆 400060)
  • 出版日期:2014-04-15 发布日期:2014-05-14
  • 作者简介:汪凌(1973—),女,工程师。研究方向:CCD器件测试和可靠性。E-mail:2909421@163.com

Effect of the Hot Carrier on the Life of the CCD On-chip Amplifier

WANG Ling,TANG Li,LIAO Xiaohang,REN Liping   

  1. (Research Section 1,Chongqing Optoelectronics Research Institute,Chongqing 400060,China)
  • Online:2014-04-15 Published:2014-05-14

摘要:

针对CCD片上放大器的寿命进行了研究。通过设计独立的MOSFET,使用衬底电流模型进行热载流子效应分析,研究其特性参数Gm退化量与退化时间关系,由此评价组成CCD片上放大器的寿命。研究结果表明,CCD片上放大器寿命随着栅长的减小而降低,制作LDD结构可提高CCD片上放大器寿命。

关键词: CCD, 放大器, 寿命, 热载流子效应

Abstract:

The life of the CCD on-chip amplifiers is studied.The relation between the characteristic parameters of Gm degradation and degradation time is found through hot carrier effect analysis using substrate current model on a tailor-made MOSFET to determine the composition of CCD on-chip amplifier life.The results show that the service life of CCD on-chip amplifiers decreases with the gate length,and the LDD structure can prolong the CCD chip amplifier service life.

Key words: CCD;amplifier;life;hot carrier effect

中图分类号: 

  • TN722