Abstract:

Based on SiO2 dielectric material noise sensitive characterization techniques on MOS device,SiO2 dielectric antiradiation methods are presented.Combined with noise measure experience and the requirements of theoretical analysis,SiO2 dielectric antiradiation nondestructive evaluation systems are developed with LabView.This system consists of data acquisition which is responsible for noise time series and spectrum acquisition and preservation,and data analysis which is responsible for characteristic value analysis of the time sequence and the spectrum,SiO2 dielectric material antiradiation capability analysis and screening of the corresponding devices.Results indicate that it is a reliable software which gives a more accurate evaluation of antiradiation on the MOSFETT.

Key words: LabView;SiO2 dielectric;material antiradiation;nondestructiveevaluation