›› 2012, Vol. 25 ›› Issue (2): 23-.

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Study of the Temperature Characteristic of the Dark Current of MPP CCD

 LEI Ren-Fang   

  1. (No.1 Research Section,Chongqing Optoelectronics Research Institute,Chongqing 400060,China)
  • Online:2012-02-15 Published:2012-02-29


The temperature characteristic of the dark current and dark current nonuniformity of both MPP CCD and non-MPP CCD is investigated.The results indicate that MPP CCD can suppress the surface dark current with lower dark current and dark current nonuniformity as contrasted with non-MPP CCD,and can work at higher temperature.

Key words: MPP CCD;dark current;temperature feature

CLC Number: 

  • TN751.1