›› 2013, Vol. 26 ›› Issue (9): 131-.

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Analysis of Uncertainty Due to Truncation in Planner Near Field Holograms

CHEN Yulin,YU Ding2   

  1. (1.Department of Microwave Technology,East China Institute of Electronic Engineering,Hefei 230031,China;2.Institute of Antenna and Electromagnetic Scattering,Xidian University,Xi'an 710071,China)
  • Online:2013-09-15 Published:2013-09-25

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Abstract:

It is necessary to analyze and research truncation error,an error that cannot be ignored in planner near field measurement.To reconstruct antenna aperture distribution and locate defective element and diagnose antenna,this paper analyzes the holograms uncertainty due to truncation.The effect of hologram amplitude and phase on different truncation angle is analyzed by the method of computer simulation.

Key words: planner near field measurement;truncation error;hologram

CLC Number: 

  • TN820

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