Electronic Science and Technology ›› 2019, Vol. 32 ›› Issue (6): 26-30.doi: 10.16180/j.cnki.issn1007-7820.2019.06.006
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SUN Likuo1,WANG Daiqiang2
Received:
2018-06-25
Online:
2019-06-15
Published:
2019-07-01
Supported by:
CLC Number:
SUN Likuo,WANG Daiqiang. Research on Fault Diagnosis of Analog Circuit Based on Elman Neural Network[J].Electronic Science and Technology, 2019, 32(6): 26-30.
Table 2
Improved diagnosis results"
故障 状态 | 诊断输出结果 | 数据 整理 | 分类 结果 | 诊断 结果 | |||
---|---|---|---|---|---|---|---|
R6↓ | 0.036 2 | 0.005 3 | 0.974 1 | 0.993 4 | 0011 | 0011 | 0001 |
0.009 5 | 0.023 1 | 0.999 9 | 0.944 0 | 0011 | 0011 | ||
R1↑ | 0.039 3 | 0.994 7 | 0.012 2 | 0.014 5 | 0100 | 0100 | 0100 |
0.015 2 | 0.979 8 | 0.004 4 | 0.000 0 | 0100 | 0100 | ||
0.080 0 | 0.968 6 | 0.001 1 | 0.002 7 | 0100 | 0100 | ||
C2↓ | 0.000 0 | 0.624 1 | 1.000 0 | 1.000 0 | 0111 | 0111 | 0110 |
0.000 0 | 0.978 3 | 0.875 5 | 1.000 0 | 0111 | 0111 | ||
0.034 2 | 0.998 4 | 0.963 0 | 1.000 0 | 0111 | 0111 | ||
R9↓ | 0.938 4 | 0.053 3 | 0.000 7 | 0.698 4 | 1001 | 1001 | 1000 |
0.986 8 | 0.008 2 | 0.001 6 | 0.933 7 | 1001 | 1001 | ||
0.580 4 | 0.009 7 | 0.000 1 | 0.649 8 | 1001 | 1001 |
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