Electronic Science and Technology ›› 2021, Vol. 34 ›› Issue (7): 26-30.doi: 10.16180/j.cnki.issn1007-7820.2021.07.005
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MA Lixin,DOU Chenfei,SONG Chencan,YANG Tianxiao
Received:
2020-04-06
Online:
2021-07-15
Published:
2021-07-05
Supported by:
CLC Number:
MA Lixin,DOU Chenfei,SONG Chencan,YANG Tianxiao. Insulator Nondestructive Testing Based on Feature Fusion CNN[J].Electronic Science and Technology, 2021, 34(7): 26-30.
Table 1.
Comparison of correctness rates under different training rates"
训练次数 | 训练率 | ||||
---|---|---|---|---|---|
0.010 0 | 0.005 0 | 0.001 0 | 0.000 5 | 0.000 1 | |
1 000 | 0.488 0 | 0.843 0 | 0.883 0 | 0.855 0 | 0.765 0 |
2 000 | 0.517 0 | 0.876 0 | 0.913 0 | 0.864 0 | 0.773 0 |
3 000 | 0.503 0 | 0.635 0 | 0.935 0 | 0.883 0 | 0.812 0 |
4 000 | 0.537 0 | 0.614 0 | 0.947 0 | 0.421 0 | 0.833 0 |
5 000 | 0.512 0 | 0.557 0 | 0.975 0 | 0.893 0 | 0.815 0 |
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